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Author (up) Fullerton, E.E.; Guimpel, J.; Nakamura, O.; Schuller, I.K.
Title Structure of high-T_{c} superlattices Type Journal Article
Year 1992 Publication Physical Review Letters Abbreviated Journal Prl
Volume 69 Issue 19 Pages 2859
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Publisher American Physical Society Place of Publication Editor
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Notes Approved no
Call Number BT @ jguimpel @ 10.1103/PhysRevLett.69.2859 Serial 612
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Author (up) Fullerton, E.E.; Kelly, D.M.; Guimpel, J.; Schuller, I.K.; Bruynseraede, Y.
Title Roughness and giant magnetoresistance in Fe/Cr superlattices Type Journal Article
Year 1992 Publication Physical Review Letters Abbreviated Journal Prl
Volume 68 Issue 6 Pages 859
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Publisher American Physical Society Place of Publication Editor
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Notes Approved no
Call Number BT @ jguimpel @ 10.1103/PhysRevLett.68.859 Serial 614
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Author (up) GUIMPEL, J.; FULLERTON, E.E.; NAKAMURA, O.; SCHULLER, I.K.
Title INTERFACE STRUCTURE IN HIGH-T(C) SUPERLATTICES Type Journal Article
Year 1993 Publication JOURNAL OF PHYSICS-CONDENSED MATTER Abbreviated Journal
Volume 5 Issue Pages A383-A384
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Abstract We have studied the structure of high-T(c) superlattices and films through refinement of the x-ray spectra. The results indicate that interdiffusion, layer thickness fluctuations and strains are present and cannot be neglected.
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ISSN 0953-8984 ISBN Medium
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Notes ISI:A1993LV24500145 Approved no
Call Number BT @ hernan @ Serial 190
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Author (up) Nakamura, O.; Fullerton, E.; Guimpel, J.; Schuller, I.
Title High Tc thin films with roughness smaller than one unit cell Type Journal Article
Year 1992 Publication Applied Physics Letters Abbreviated Journal Appl. Phys. Lett.
Volume 60 Issue 1 Pages 120
Keywords High?Tc Superconductors; Thin Films; Superlattices; Epitaxy; Magnetrons; Sputtering; Roughness; Thickness
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Publisher Aip Place of Publication Editor
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Notes Approved no
Call Number BT @ jguimpel @ Serial 610
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Author (up) Nakamura, O.; Fullerton, E.E.; Guimpel, J.; Schuller, I.K.
Title Disorder and superconductivity in YBa2Cu3O7−δ/GdBa2Cu3O7-δ superlattices Type Journal Article
Year 1991 Publication Physica C: Superconductivity Abbreviated Journal
Volume 185-189, Part 3 Issue Pages 2069-2070
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Abstract The structure of coriented YBa2Cu3O7−δ/GdBa2Cu3O7−δ superlattices is analyzed throug refinement of the X-ray diffraction spectrum. This novel technique, similar in spirit to the well known Rietveld refinement of powder X-ray diffraction spectra, allows quantitative determination of the interfacial roughness. The results show that for these superlattices the roughness consists in step disorder of one unit cell around the average thickness of the layer and interdiffusion of 15 to 25% between the Y and Gd sites within one unit cell from the interface.
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ISSN 0921-4534 ISBN Medium
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Notes Approved no
Call Number BT @ jguimpel @ Serial 617
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