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Author |
Gao, Z.X.; Heyvaert, I.; Wuyts, B.; Osquiguil, E.; Haesendonck, C.V.; Bruynseraede, Y. |
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Title |
Evidence for a “brick wall” microstructure in epitaxial YBa 2Cu3Ox films |
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Journal Article |
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Year |
1994 |
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Applied Physics Letters |
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65 |
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6 |
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770-772 |
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Abstract |
We have measured the in-plane (ab plane) critical current density J c in sputtered, c-axis oriented YBa2Cu3O x films as a function of the oxygen content x. The important reduction of Jc with decreasing x can be explained in terms of a “brick wall” microstructure, where the critical current density is dominated by the coupling strength (along the c axis) between the superconducting CuO 2 planes. Scanning tunneling microscopy images of the film surfaces are consistent with the presence of the brick wall structure, which apparently results from the overlap between terraces belonging to adjacent spiral-shaped islands. |
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Address |
Laboratorium voor Vaste-Stoffysica en Magnetisme, Katholieke Universiteit Leuven, Celestijnenlaan 200D, B-3001 Leuven, Belgium |
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00036951 (ISSN) |
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Notes |
Export Date: 17 April 2009; Source: Scopus; doi: 10.1063/1.112225; Language of Original Document: English; Correspondence Address: Gao, Z.X.; Laboratorium voor Vaste-Stoffysica en Magnetisme; Katholieke Universiteit Leuven; Celestijnenlaan 200D B-3001 Leuven, Belgium |
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Call Number |
BT @ osquigui @ |
Serial |
391 |
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