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Author Alcalde Bessia, F.; Pérez, M.; Gomez Berisso, M.; Piunno, N.; Mateos, H.; Pomiro, F.J.; Sidelnik, I.; Blostein, J.J.; Sofo Haro, M.; Lipovetzky, J. url  openurl
  Title X-ray micrographic imaging system based on COTS CMOS sensors Type Conference Article
  Year 2017 Publication 2017 Argentine Conference of Micro-Nanoelectronics, Technology and Applications (CAMTA) Abbreviated Journal  
  Volume Issue Pages 1-4  
  Keywords biological techniques; biology computing; CMOS image sensors; image processing equipment; X-ray imaging; X-ray image acquisition; X-ray micrographic imaging system; Commercial Off The Shelf CMOS image sensors; biology; paleontology research; scintillator conversion layers; electronic components inspection; COTS CMOS sensors; electron volt energy 8.0 keV; Photonics; X-ray imaging; Silicon; Attenuation; Detectors; Image sensors; Cmos; Vlsi; X-ray applications; Biomedical imaging; CMOS image sensors  
  Abstract This paper presents the use of Commercial Off The Shelf CMOS image sensors for the acquisition of X-ray images with high spatial resolution. The X-ray images, with application in biology, electronic components inspection or paleontology research, are obtained with 8 keV photons from a Cu tube. The quantum efficiency of the detector is estimated using attenuation lengths of photons in the sensor, and compared to traditional scintillator conversion layers.  
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  Language Summary Language Original Title  
  Series Editor Series Title Abbreviated Series Title 2017 Argentine Conference of Micro-Nanoelectronics, Technology and Applications (CAMTA)  
  Series Volume Series Issue Edition  
  ISSN ISBN Medium  
  Area Expedition Conference  
  Notes Approved no  
  Call Number BT @ pedrazp @ Serial 831  
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