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Abstract |
We have investigated the time dependence of the magnetic and transport properties of La0.6Sr0.4MnO3 films and bulk samples. A significant magnetic aftereffect has been observed in all the samples through magnetization and resistivity measurements. The relaxation effects can be described by the addition of a logarithmic to an exponential contribution. The weight of each contribution is strongly temperature dependent, with a relaxation that is predominantly logarithmic at low temperatures (T<30 K) and exponential at high temperatures (T>100 K). As the film thickness is decreased the magnetic relaxation becomes more important and the magnetic viscosity of the system increases. These results point out the important role of structural defects in the magnetic relaxation of the samples. |
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