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Author (up) Bressan, O.J.; Ridner, A.E.; de la Cruz, F. doi  openurl
  Title Low angle electron scattering in thermal resistivity Type Journal Article
  Year 1975 Publication Journal of Physics F: Metal Physics Abbreviated Journal J. Phys. F: Met. Phys.  
  Volume 5 Issue Pages 1902-1909  
  Abstract Electrical ( rho ) and thermal (W) resistivity measurements in very dilute In alloys between 1K and 4K show a temperature dependence expressed by rho = rho 0+ beta T5 and WT=(WT)0+AT3+BT5. The BT5 term in the thermal resistivity is due to a contribution from a 'diffusion-like process' of electrons over the Fermi surface, as is the one that describes the temperature dependence of the electrical resistivity. This claim is supported by the experimental fact that the Lorenz number defined as L= beta /B coincides with the value given by L= rho 0/(WT)0 which in turn agrees with the free electron value within 15%.  
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  Call Number BT @ pedrazp @ Serial 550  
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