| Record |
| Author |
Benfica, J.; Green, B.; Porcher, B.C.; Bolzani Poehls, L.; Vargas, F.; Medina, N.H.; Added, N.; de Aguiar, V.A.P.; Macchione, E.L.A.; Aguirre, F.; Silveira, M.A.G.; Pérez, M.; Sofo Haro, M.; Sidelnik, I.; Blostein, J.J.; Lipovetzky, J.; Bezerra, E.A. |
| Title |
Analysis of SRAM-Based FPGA SEU Sensitivity to Combined EMI and TID-Imprinted Effects |
Type |
Journal Article |
| Year |
2016 |
Publication |
IEEE Transactions on Nuclear Science |
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| Volume |
63 |
Issue |
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Pages |
1294 |
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no |
| Call Number |
BT @ pedrazp @ |
Serial |
753 |
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