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Author (up) Morán M.,Condó A. M. ,Suarez S. ,Soldera F., Haberkorn N. doi  openurl
  Title Ion implantation inducing two-way shape memory effect in Cu-Al-Ni thin films Type Journal Article
  Year 2019 Publication Materials Letters Abbreviated Journal  
  Volume 255 Issue Pages 126569  
  Abstract We report two-way shape memory effect (TWSME) induced by Al ion implantation in 6 μm thick Cu-Al-Ni thin films. The films display an average grain size of 3.7 μm and a martensitic transformation temperature (MS) of ≈ 240 K. The film was irradiated with 2 MeV Al ions with a fluence of 6 × 10^15−2 (penetration distance up to ≈ 1.1 μm). After irradiation, the film displays well defined TWSME with a radius of curvature of ≈ 1 mm. The results indicate that the irradiation produces mainly changes in the austenitic order.  
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  Call Number BT @ nhaberk @ Serial 829  
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