||We report two-way shape memory effect (TWSME) induced by Al ion implantation in 6â€¯Î¼m thick Cu-Al-Ni thin films. The films display an average grain size of 3.7â€¯Î¼m and a martensitic transformation temperature (MS) of â‰ˆ 240â€¯K. The film was irradiated with 2â€¯MeV Al ions with a fluence of 6â€¯Ã—â€¯10^15â€¯ion.cmâˆ’2 (penetration distance up to â‰ˆ 1.1â€¯Î¼m). After irradiation, the film displays well defined TWSME with a radius of curvature of â‰ˆ 1â€¯mm. The results indicate that the irradiation produces mainly changes in the austenitic order.