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Benfica, J., B. Green, B. C. Porcher, L. Bolzani Poehls, F. Vargas, N. H. Medina, N. Added, V. A. P. de Aguiar, E. L. A. Macchione, F. Aguirre et al. "Analysis of SRAM-Based FPGA SEU Sensitivity to Combined EMI and TID-Imprinted Effects." IEEE Transactions on Nuclear Science 63 (2016): 1294.
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