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Griessen, R., Wen Hai-Hu, A. J. J. Van Dalen, B. Dam, J. Rector, H. G. Schnack, S. Libbrecht, E. Osquiguil, and Y. Bruynseraede. "Evidence for mean free path fluctuation induced pinning in YBa2Cu3O7 and YBa2Cu4O8 films." Physical Review Letters 72, no. 12 (1994): 1910–1913.
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