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Ale Crivillero, M. V., N. Haberkorn, G. Nieva, and J. Guimpel. "Electrical transport properties of FeSe/Fe3O4 bilayers." Materials Today: Proceedings 14 (2019): 18–21.
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Dediu, V. I., Q. D. Jiang, F. C. Matacotta, P. Scardi, M. Lazzarino, G. Nieva, and L. Civale. "Deposition of MBa2Cu3O7-x thin films by channel-spark method." Superconductor Science and Technology 8, no. 3 (1995): 160.
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Fernandes, A., I. Chan, J. Guimpel, O. Nakamura, D. Lederman, and I. Schuller. "Scaling of critical currents in high-temperature superconducting superlattices and thin films." Applied Physics Letters 61, no. 26 (1992): 3181.
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Gonzalez, E. M., Z. Sefrioui, B. Maiorov, E. Osquiguil, and Santamar. "Effects of structural microdomains on the vortex correlation length in a-axis oriented EuBa2Cu3O7 thin films." Journal of Physics and Chemistry of Solids 67, no. 1-3 (2006): 399–402.
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Hofer, J. A., and N. Haberkorn. "Flux flow velocity instability and quasiparticle relaxation time in nanocrystalline β-W thin films." Thin Solid Films 730 (2021): 138690.
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Hofer, J. A., S. Bengio, G. Rozas, P. D. Pérez, M. Sirena, S. Suárez, and N. Haberkorn. "Compositional effects on the electrical properties of extremely disordered molybdenum oxynitrides thin films." Materials Chemistry and Physics 242 (2020): 122075.
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Lederman, D., J. Hasen, I. K. Schuller, E. Osquiguil, and Y. Bruynseraede. "Photoinduced superconductivity and structural changes in high temperature superconducting films." Applied Physics Letters 64, no. 5 (1994): 652–654.
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Lederman, D., E. Osquiguil, G. Nieva, J. Guimpel, J. Hasen, Y. Bruynseraede, and I. K. Schuller. "Photoinduced enhancement of superconductivity." Journal of Superconductivity 7, no. 1 (1994): 127–130.
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Machain, P., A. M. Condó, P. Domenichini, G. Pozo López, M. Sirena, V. F. Correa, and N. Haberkorn. "Martensitic transformation in as-grown and annealed near-stoichiometric epitaxial Ni2MnGa thin films." Philosophical Magazine 95, no. 23 (2015): 2527–2538.
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Nakamura, O., E. Fullerton, J. Guimpel, and I. Schuller. "High Tc thin films with roughness smaller than one unit cell." Applied Physics Letters 60, no. 1 (1992): 120.
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