Alcalde Bessia, F., M. Pérez, M. Gomez Berisso, N. Piunno, H. Mateos, F. J. Pomiro, I. Sidelnik, J. J. Blostein, M. Sofo Haro, and J. Lipovetzky. "X-ray micrographic imaging system based on COTS CMOS sensors." In 2017 Argentine Conference of Micro-Nanoelectronics, Technology and Applications (CAMTA), 1–4. 2017 Argentine Conference of Micro-Nanoelectronics, Technology and Applications (CAMTA)., 2017.
Abstract: This paper presents the use of Commercial Off The Shelf CMOS image sensors for the acquisition of X-ray images with high spatial resolution. The X-ray images, with application in biology, electronic components inspection or paleontology research, are obtained with 8 keV photons from a Cu tube. The quantum efficiency of the detector is estimated using attenuation lengths of photons in the sensor, and compared to traditional scintillator conversion layers.
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