Author  |
Title |
Year |
Publication |
Volume |
Pages |
Decca, R.S.; Drew, H.D.; Maiorov, B.; Guimpel, J.; Osquiguil, E. |
Photoinduced superconducting nanowires in GdBa2Cu3O6.5 films |
1998 |
Applied Physics Letters |
73 |
120-122 |
Decca, R.S.; Drew, H.D.; Maiorov, B.; Guimpel, J.; Osquiguil, E. |
Superconducting Materials Engineered Using a Near-Field Scanning Optical Microscope |
1998 |
Scanning |
20 |
|
Decca, R.S.; Drew, H.D.; Maiorov, B.; Guimpel, J.; Osquiguil, E. |
Superconducting Materials Engineered Using a Near-Field Scanning Optical Microscope |
1998 |
Scanning |
20 |
156 |
Decca, R.S.; Drew, H.D.; Maiorov, B.; Guimpel, J.; Osquiguil, E.J. |
Inducing superconductivity at a nanoscale: Photodoping with a near- field scanning optical microscope |
1999 |
Journal of Microscopy |
194 |
407-411 |
Decca, R.S.; Drew, H.D.; Osquiguil, E.; Maiorov, B.; Guimpel, J. |
Anomalous proximity effect in underdoped YBa2Cu3O6+x Josephson junctions |
2000 |
Physical Review Letters |
85 |
3708-3711 |
Dolz, M.I.; Bolecek, N.R.C.; Puig, J.; Pastoriza, H.; Nieva, G.; Guimpel, J.; van der Beek, C.J.; Konczykowski, M.; Fasano, Y. |
Enhancement of penetration field in vortex matter in mesoscopic superconductors due to Andreev bound states |
2019 |
Physical Review B |
100 |
064508 |
Esparza, D.A.; D'Ovidio, C.A.; Guimpel, J.; Osquiguil, E.; Civale, L.; de la Cruz, F. |
The granular nature of bulk superconductivity at 40K in La1.8Sr0.2CuO4 |
1987 |
Solid State Communications |
63 |
137-140 |
Espinoza Torres, C.; Condó, A.M.; Haberkorn, N.; Zelaya, E.; Schryvers, D.; Guimpel, J.; Lovey, F.C. |
Structures in textured Cu-Al-Ni shape memory thin films grown by sputtering |
2014 |
Materials Letters |
96 |
256-262 |
Facio, J.I.; Abate, A.; Guimpel, J.; Cornaglia, P.S. |
Vortex kinks in superconducting films with periodically modulated thickness |
2013 |
Journal of Physics: Condensed Matter |
25 |
245701 |
Fainstein, A.; Etchegoin, P.; Guimpel, J. |
Raman study of photoinduced chain-fragment ordering in GdBa2Cu3Ox thin films |
1998 |
PHYSICAL REVIEW B |
58 |
9433-9439 |