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Author Title (up) Year Publication Volume Pages
Bud'ko, S.L.; Nakamura, O.; Guimpel, J.; Maple, M.; Schuller, I.K. Anisotropic pressure dependence of the critical temperature of REBa2Cu3O7−δ 1991 Physica C: Superconductivity 185-189, Part 3 1947-1948
Fainstein, A.; Maiorov, B.; Guimpel, J.; Nieva, G.; Osquiguil, E. Annealing disorder and photoinduced order of oxygen chains in detwinned YBa2Cu3O6.65 single crystals probed by Raman scattering 2000 Physical Review B – Condensed Matter and Materials Physics 61 4298-4304
Decca, R.S.; Drew, H.D.; Osquiguil, E.; Maiorov, B.; Guimpel, J. Anomalous proximity effect in underdoped YBa2Cu3O6+x Josephson junctions 2000 Physical Review Letters 85 3708-3711
Haberkorn, N.; Guimpel, J.; Sirena, M.; Steren, L.B.; Saldarriaga, W.; Baca, E.; Gomez, M.E. Antiferromagnetism at the YBa2Cu3O7/La2/3Ca1/3MnO3 interface 2004 Applied Physics Letters 84 3927-3929
Guimpel, J.; Pastoriza, H. Arquitectura a escala nanoscopica 2004 Ciencia Hoy 14 39-44
Celedón, C.E.; Sánchez, E.A.; Salazar Alarcón, L.; Guimpel, J.; Cortés, A.; Vargas, P.; Arista, N.R. Band structure effects in the energy loss of low-energy protons and deuterons in thin films of Pt 2015 Materials Letters 360 103-110
Safar, H.; Pastoriza, H.; Guimpel, J.; Cruz, F. de la; Bishop, D.J.; Schneemeyer, L.F.; Waszczak, J.V. Breakdown of the Meissner state in YBa$2$Cu$3$O7-? 1990 Transport properties of superconductors 140
Haberkorn, N.; Condó, A.M.; Espinoza, C.; Jaureguizahar, S.; Guimpel, J.; Lovey, F.C. Bulk-like behavior in the temperature driven martensitic transformation of Cu-Zn-Al thin films with 2H structure 2014 Materials Letters 591 263-267
Nieva, G.; Lee, B. W.; Guimpel, J.; Iwasaki, H.; Maple, M. B.; Schuller, I.K. Changes in the Pr-induced TC depression of 123 compounds by chemical pressure 1991 Physica C: Superconductivity 185-189 561-562
Lipovetzky, J.; Alcalde Bessia, F.; Guimpel, J.; Perez, M.; Gomez Berisso, M. Characterization of a low-power CMOS operational amplifier from 12.5K to 273K for low temperature experiments 2020 2020 Argentine Conference on Electronics (CAE) 73-76