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| Author | Title | Year | Publication | Volume  |
Pages |
|---|---|---|---|---|---|
| Benfica, J.; Green, B.; Porcher, B.C.; Bolzani Poehls, L.; Vargas, F.; Medina, N.H.; Added, N.; de Aguiar, V.A.P.; Macchione, E.L.A.; Aguirre, F.; Silveira, M.A.G.; Pérez, M.; Sofo Haro, M.; Sidelnik, I.; Blostein, J.J.; Lipovetzky, J.; Bezerra, E.A. | Analysis of SRAM-Based FPGA SEU Sensitivity to Combined EMI and TID-Imprinted Effects | 2016 | IEEE Transactions on Nuclear Science | 63 | 1294 |