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Author  |
Title | Year | Publication | Volume | Pages |
|---|---|---|---|---|---|
| Alcalde Bessia, F.; Pérez, M.; Sofo Haro, M.; Sidelnik, I.; Blostein, J.J.; Suárez, S.; Pérez, P.; Gómez Berisso, M.; Lipovetzky, J. | Displacement Damage in CMOS Image Sensors After Thermal Neutron Irradiation | 2018 | IEEE Transactions on Nuclear Science | 65 | 2793-2801 |