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Alcalde Bessia, F.; Pérez, M.; Sofo Haro, M.; Sidelnik, I.; Blostein, J.J.; Suárez, S.; Pérez, P.; Gómez Berisso, M.; Lipovetzky, J. Displacement Damage in CMOS Image Sensors After Thermal Neutron Irradiation 2018 IEEE Transactions on Nuclear Science 65 2793-2801 details   doi
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